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Infrared and Laser Engineering, Volume. 46, Issue 4, 420002(2017)

Study on connected defective elements in focal plane array identification by response and crosstalk

Hou Zhijin1...2,3,*, Fu Li1, Wang Wei2,3, Lv Yanqiu2,3, Lu Zhengxiong2,3, and Wang Jinchun23 |Show fewer author(s)
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  • 1[in Chinese]
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    Hou Zhijin, Fu Li, Wang Wei, Lv Yanqiu, Lu Zhengxiong, Wang Jinchun. Study on connected defective elements in focal plane array identification by response and crosstalk[J]. Infrared and Laser Engineering, 2017, 46(4): 420002

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    Paper Information

    Category: 光电器件与微系统

    Received: Aug. 8, 2016

    Accepted: Sep. 20, 2016

    Published Online: Jun. 30, 2017

    The Author Email: Zhijin Hou (changhui090504@126.com)

    DOI:10.3788/irla201746.0420002

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology