Journal of Applied Optics, Volume. 42, Issue 5, 884(2021)

Structured light scanning measurement method based on mechanical splicing

Qiong WU1... Wei LIU1,*, Zhilong ZHOU1, Yuxin WANG1 and Yi YUE2 |Show fewer author(s)
Author Affiliations
  • 1School of Mechanical Engineering, Dalian University of Technology, Dalian 116033, China
  • 2Beijing Spacecraft Manufacturing Factory Co.,Ltd., Beijing 100080, China
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    Figures & Tables(12)
    Splicing measurement system
    Scanner measurement coordinates transformation
    Flow chart of algorithm
    Physical picture of measurement system
    Point cloud fitting of target sphere
    Calibration target scale and verification target scale
    Support feature surface objects and point cloud splicing
    • Table 1. Key parameters of scanner

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      Table 1. Key parameters of scanner

      Z轴方向 精度/μm [X]×[Y] 分辨率/μm 标称 精度/μm 工作 距离/mm 视野 范围/mm
      220~251287+2527×45~30×45
    • Table 2. Key parameters of translation platform

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      Table 2. Key parameters of translation platform

      传感器 分辨率/μm 行程/mm单向重复 定位精度/μm 双向重复 定位精度/μm 最大 负载/N
      0.1204±0.1±0.21000
    • Table 3. External parameters of measurement system

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      Table 3. External parameters of measurement system

      外参数值标准差
      $\cos {\alpha _1}$0.025 815 72.985 0e-13
      $\cos {\theta _1}$0.999 5571.292 9e-06
      $\cos {\beta _1}$0.014 825 68.753 2e-05
      $\cos {\alpha _2}$0.999 5102.274 7e-07
      $\cos {\theta _2}$−0.024 519 83.784 0e-11
      $\cos {\beta _2}$−0.019 459 51.167 9e-05
    • Table 4. Partial data of sphere-center distance mm

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      Table 4. Partial data of sphere-center distance mm

      1-2球心距1-3球心距1-4球心距1-5球心距
      球序号No.124.777149.784269.689299.542
      No.224.778149.790269.694299.548
      No.324.777149.794269.701299.554
      No.424.778149.781269.696299.546
      No.524.780149.809269.708299.556
      No.624.777149.818269.697299.549
      No.724.778149.813269.700299.553
      No.824.777149.812269.711299.565
      验证 结果 平均值24.778149.800269.699299.551
      实际值24.758149.842269.716299.546
      标准差0.0010.0140.0070.007
      RMSE0.0190.0440.0180.008
    • Table 5. Height difference between feature surface and datum plane mm

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      Table 5. Height difference between feature surface and datum plane mm

      面序号高度差
      10.004
      23.312
      33.296
      4−0.005
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    Qiong WU, Wei LIU, Zhilong ZHOU, Yuxin WANG, Yi YUE. Structured light scanning measurement method based on mechanical splicing[J]. Journal of Applied Optics, 2021, 42(5): 884

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    Paper Information

    Category: OPTICAL METROLOGY AND MEASUREMENT

    Received: Dec. 9, 2020

    Accepted: --

    Published Online: Sep. 23, 2021

    The Author Email: LIU Wei (lw2007@dlut.edu.cn)

    DOI:10.5768/JAO202142.0503002

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