Researching | Analysis and Calculation of Veiling Glare Index of Optical Imaging Systems

Laser & Optoelectronics Progress, Volume. 55, Issue 12, 122901(2018)

Analysis and Calculation of Veiling Glare Index of Optical Imaging Systems

Lin Sun and Qingfeng Cui^*

Author Affiliations

College of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun, Jilin 130022, China

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Figures&Tables (6)

References (13)

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Figures & Tables(6)

Fig. 1. Schematic of TracePro software

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Fig. 2. Structure diagram of R-C optical system

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Fig. 3. PST simulation results

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Fig. 4. PST simulation results when 0.5°≤θ≤3°

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Fig. 5. PST simulation results when 3°<θ≤90°

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Table 1. ABg parameters for the surface of each material
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Table 1. ABg parameters for the surface of each material
Device A B g Reflectivity Transmissivity Absorptivity
Reflector 0.003045 0.001 1 0.98
Lens 0.0006372 0.0001 1 0.995
Black paint 0.000465 0.001 3.5 0.95

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Lin Sun, Qingfeng Cui. Analysis and Calculation of Veiling Glare Index of Optical Imaging Systems[J]. Laser & Optoelectronics Progress, 2018, 55(12): 122901

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Paper Information

Category: Scattering

Received: Jun. 19, 2018

Accepted: Jul. 5, 2018

Published Online: Aug. 1, 2019

The Author Email: Cui Qingfeng (qf_cui@163.com)

DOI:10.3788/LOP55.122901

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology