Optics and Precision Engineering, Volume. 18, Issue 1, 37(2010)
Thermal wave detection and defect depth measurement based on lock-in thermography
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LIU Jun-yan, DAI Jing-min, WANG Yang. Thermal wave detection and defect depth measurement based on lock-in thermography[J]. Optics and Precision Engineering, 2010, 18(1): 37
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Received: Nov. 19, 2008
Accepted: --
Published Online: Aug. 31, 2010
The Author Email: Jun-yan LIU (ljywlj@hit.edu.cn)
CSTR:32186.14.
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