[1] [1] Petrache E, Rachidi F, Paolone M, et al. Lightning induced disturbances in buried cables—Part I: Theory［J］. IEEE Trans Electromagnetic Compatibility, 2005,47(3):498-508.

[2] [2] Theethayi N, Thottappillil R, Paolone M, et al. External impedance and admittance of buried horizontal wires for transient studies using transmission line analysis［J］. IEEE Trans Dielectrics & Electrical Insulation, 2007,14(3):751-761.

[5] [5] Xu F, Liu C, Hong W, et al. Fast and accurate transient analysis of buried wires and its applications［J］. IEEE Trans Electromagnetic Compatibility, 2014,56(1):188-199.

[8] [8] Guo J, Xie Y, Qiu A . Calculation of lightning induced voltages on overhead lines using an analytical fitting representation of electric fields［J］. IEEE Trans Electromagnetic Compatibility, 2016:1-8.

[9] [9] Liu X, Cui X, Qi L. Calculation of lightning-induced overvoltages on overhead lines based on DEPACT macromodel using circuit simulation software［J］. IEEE Trans Electromagnetic Compatibility, 2012,54(4):837-849.

[10] [10] Paul C R. Analysis of multiconductor transmission lines［M］. NewYork: Wiley, 1994.

[11] [11] Du Z, Xie Y Z, Canavero F G. A Spice-compatible macromodel for field coupling to multiconductor transmission lines based on the analog behavioral modeling［J］. IEEE Trans Electromagnetic Compatibility, 2018:1-7.

[12] [12] Papadopoulos T A, Tsiamitros D A, Papagiannis G K. Impedances and admittances of underground cables for the homogeneous earth case［J］. IEEE Trans Power Delivery, 2010,25(2):961-969.

[13] [13] Papagiannis G K, Tsiamitros D A, Labridis D P, et al. Direct numerical evaluation of earth return path impedances of underground cables［J］. IEE Proceedings-Generation, Transmission and Distribution, 2005,152(3):321.

[15] [15] Xie H, Yong L, Qiao H, et al. Empirical formula of effective coupling length for transmission lines illuminated by E1 HEMP［J］. IEEE Trans Electromagnetic Compatibility, 2016,58(2):581-587.

[16] [16] Tesche F M, Ianoz M V, Karlsson T. EMC analysis methods and computational models［M］. NewYork: Wiley, 1997.