Chinese Journal of Quantum Electronics, Volume. 17, Issue 1, 90(2000)
Measurement System of Angle-resolved Scattering under Multiwavelength Illumination
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement System of Angle-resolved Scattering under Multiwavelength Illumination[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 90