Chinese Journal of Quantum Electronics, Volume. 17, Issue 1, 90(2000)
Measurement System of Angle-resolved Scattering under Multiwavelength Illumination
In this paper, the principle and automatic measurement system of angle-resolved scattering are described. The dynamic range, sensitivity and reproductively are discussed. The angle-resolved scattering distribution and polarization properties of polytetrafluoroethylene diffuse reflectance plate are measured under multiwavelength laser illumination in order to test the system function and properties.
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement System of Angle-resolved Scattering under Multiwavelength Illumination[J]. Chinese Journal of Quantum Electronics, 2000, 17(1): 90
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