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Laser & Optoelectronics Progress, Volume. 54, Issue 4, 40001(2017)

Quantitative Phase Microscopy Imaging Based on Ptychography

Pan An1,2、*, Zhang Yan1,2, Zhao Tianyu1,2, Wang Zhaojun1,2, Dan Dan1,2, Shi Yishi2,3, and Yao Baoli1
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  • 1[in Chinese]
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    Pan An, Zhang Yan, Zhao Tianyu, Wang Zhaojun, Dan Dan, Shi Yishi, Yao Baoli. Quantitative Phase Microscopy Imaging Based on Ptychography[J]. Laser & Optoelectronics Progress, 2017, 54(4): 40001

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    Paper Information

    Category: Reviews

    Received: Nov. 2, 2016

    Accepted: --

    Published Online: Apr. 19, 2017

    The Author Email: An Pan (panan@opt.cn)

    DOI:10.3788/lop54.040001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology