Journal of Atomic and Molecular Physics, Volume. 25, Issue 2, 313(2008)
Measurement of semiconductor bridge plasma temperature using spectroscopic method
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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of semiconductor bridge plasma temperature using spectroscopic method[J]. Journal of Atomic and Molecular Physics, 2008, 25(2): 313
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