Research on aerosol recognition and particle size distribution inversion based on scattering matrix

CHEN Minwang; QIU Zhenwei; HONG Jin

doi:10.3969/j.issn.1673-6141.2023.03.001

Journal of Atmospheric and Environmental Optics, Volume. 18, Issue 3, 191(2023)

Research on aerosol recognition and particle size distribution inversion based on scattering matrix

CHEN Minwang^1,2, QIU Zhenwei^2、*, and HONG Jin²

¹School of Environmental Science and Optoelectronic Technology, University of Science and Technology of China, Hefei 230026, China

²Key Laboratory of Optical Calibration and Characterization, Anhui Institute of Optics and Fine Mechanics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China

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Figures & Tables(7)

Fig. 1. Schematic diagram of polarized nephelometer^[10]

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Fig. 2. Typical particle size distribution of aerosols generated by ATM226

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Fig. 3. Scattering matrix measurement results of PAO aerosol. (a) F₁₁/F₁₁(30°)_{; (b) F₁₂/F₁₁; (c) F₂₂/F₁₁;(d) F₃₃/F₁₁;(e) F₃₄/F₁₁; (f) F₄₄/F₁₁}

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Fig. 4. Scattering matrix measurement results of NaCl aerosol. (a) F₁₁/F₁₁(30°); (b) F₁₂/F₁₁; (c) F₂₂/F₁₁;(d) F₃₃/F₁₁;(e) F₃₄/F₁₁; (f) F₄₄/F₁₁

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Fig. 5. Mie theoretical calculation results of different variances. (a) F₁₁/F₁₁(30°); (b) F₁₂/F₁₁; (c) F₃₃/F₁₁;(d) F₃₄/F₁₁

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Fig. 6. Mie theoretical calculation results of different average radius. (a) F₁₁/F₁₁(30°); (b) F₁₂/F₁₁; (c) F₃₃/F₁₁;(d) F₃₄/F₁₁

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Fig. 7. Comparison of PAO aerosol measurement results and Mie theoretical results calculated by inversion parameters.(a) F₁₁/F₁₁(30°); (b) F₁₂/F₁₁; (c) F₂₂/F₁₁; (d) F₃₃/F₁₁;(e) F₃₄/F₁₁; (f) F₄₄/F₁₁

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Minwang CHEN, Zhenwei QIU, Jin HONG. Research on aerosol recognition and particle size distribution inversion based on scattering matrix[J]. Journal of Atmospheric and Environmental Optics, 2023, 18(3): 191

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Paper Information

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Received: Mar. 11, 2021

Accepted: --

Published Online: Jun. 29, 2023

The Author Email: QIU Zhenwei (zwqiu@aiofm.ac.cn)

DOI:10.3969/j.issn.1673-6141.2023.03.001

Topics

laser devices and laser physics

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laser manufacturing

Instrumentation, Measurement and Metrology