Electronics Optics & Control, Volume. 20, Issue 1, 74(2013)
Integrated Diagnostics Oriented Optimized Allocation of Electronic Equipment's Test Resource
[1] [1] RAGHURAJ R,BHUSHAN M,RENGASWAMY R.Locating sensors in complex chemical plants based on fault diagnostic observability criteria[J].American Institute of Chemistry Engineering Journal,1999,45(2):310-322.
[3] [3] BAGAJEWICZ M,FUXMAN A,URIBE A.Instrumentation network design and upgrade for process monitoring and fault detection[J].American Institute of Chemistry Engineering Journal,2004,50(8):1870-1880.
[7] [7] FIJANY A,VATAN F.A new efficient algorithm for analyzing and optimizing the system of sensors[C]//IEEE Aerospace Conference,2006:1-8.
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DU Minjie, CAI Jinyan, LIU Limin. Integrated Diagnostics Oriented Optimized Allocation of Electronic Equipment's Test Resource[J]. Electronics Optics & Control, 2013, 20(1): 74
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Received: Dec. 25, 2011
Accepted: --
Published Online: Jan. 24, 2013
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