Considering the requirements of integrated diagnostics to electronic equipment for test resource allocation we established the optimized allocation models of Built-In Test Equipment (BITE) and Automatic Test Equipment (ATE) based on test points' optimization.Taking the minimum test cost as the optimization object and with the constraint conditions of fault detection rate fault isolation rate and false alarm rate this model was solved by LINGO.The results indicated that this method can meet the testability indicators while reducing the test cost which is of great significance to hierarchy design and diagnostics of equipment for increasing logistic support efficiency as well as decreasing life-cycle cost.