Optical Instruments, Volume. 37, Issue 5, 456(2015)
Thermal stability and interfacial characterization of Co/Mo2C multilayer
Thermal stability of the multilayer plays an important role in the applications. Co/Mo2C multilayer working at 778 eV was designed and fabricated by direct current magnetron sputtering, and the characterization was performed by using X-ray reflection and X-ray diffraction. The experimental results indicate great thermal stability with its period contraction. The as-deposited Co/Mo2C multilayer is in amorphous and has a good interface, while interfacial diffusion appears as the annealing temperature rising, and the Co-on-Mo2C interface is more stable than the Mo2C-on-Co interface due to Co3Mo crystalline alloy generated in Mo2C-on-Co interface.
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FENG Zhixiang, LI Haochuan, ZHU Jingtao, WU Wenjuan. Thermal stability and interfacial characterization of Co/Mo2C multilayer[J]. Optical Instruments, 2015, 37(5): 456
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Received: Feb. 3, 2015
Accepted: --
Published Online: Jan. 19, 2016
The Author Email: Zhixiang FENG (tongjifzx@yeah.net)