Optical Instruments, Volume. 37, Issue 5, 456(2015)

Thermal stability and interfacial characterization of Co/Mo2C multilayer

FENG Zhixiang1,*... LI Haochuan1, ZHU Jingtao1 and WU Wenjuan2 |Show fewer author(s)
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • show less

    Thermal stability of the multilayer plays an important role in the applications. Co/Mo2C multilayer working at 778 eV was designed and fabricated by direct current magnetron sputtering, and the characterization was performed by using X-ray reflection and X-ray diffraction. The experimental results indicate great thermal stability with its period contraction. The as-deposited Co/Mo2C multilayer is in amorphous and has a good interface, while interfacial diffusion appears as the annealing temperature rising, and the Co-on-Mo2C interface is more stable than the Mo2C-on-Co interface due to Co3Mo crystalline alloy generated in Mo2C-on-Co interface.

    Tools

    Get Citation

    Copy Citation Text

    FENG Zhixiang, LI Haochuan, ZHU Jingtao, WU Wenjuan. Thermal stability and interfacial characterization of Co/Mo2C multilayer[J]. Optical Instruments, 2015, 37(5): 456

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category:

    Received: Feb. 3, 2015

    Accepted: --

    Published Online: Jan. 19, 2016

    The Author Email: Zhixiang FENG (tongjifzx@yeah.net)

    DOI:10.3969/j.issn.1005-5630.2015.05.016

    Topics