Acta Optica Sinica, Volume. 32, Issue 11, 1112004(2012)

A Precision Length Measurement Route by Phase-Shifting Inteferometry with Mechanical Scanning

Luo Zhiyong*, Gu Yingzi, and Chen Zhaohui
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  • [in Chinese]
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    Based on the application background of length measurement, a novel phase-shifting interferometry is presented. A precise phase-shifting device for length measurement by pressure variation is developed. This device based on single-quartz component is made to carry out the generation of triple phase-shifting, and an essential technique to make online calibration of the capacitor sensor is also realized. The original phase is solved by the developed five-interferogram algorithm with the uncertainty of 0.01% phase periods. The experimental results show that the phase-shifting obtained by this device is up to 1 μm and the variation for length measurement is 0.5 nm.

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    Luo Zhiyong, Gu Yingzi, Chen Zhaohui. A Precision Length Measurement Route by Phase-Shifting Inteferometry with Mechanical Scanning[J]. Acta Optica Sinica, 2012, 32(11): 1112004

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    Paper Information

    Received: Apr. 11, 2012

    Accepted: --

    Published Online: Oct. 25, 2012

    The Author Email: Zhiyong Luo (luozhy@nim.ac.cn)

    DOI:10.3788/aos201232.1112004

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