Opto-Electronic Engineering, Volume. 42, Issue 11, 37(2015)
Anti Light Disturbance Analysis of the Measurement of High Precision Micro Displacement
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LOU Shuqi, BAI Jian, LU Qianbo, LIAN Wenxiu, JIAO Xufen. Anti Light Disturbance Analysis of the Measurement of High Precision Micro Displacement[J]. Opto-Electronic Engineering, 2015, 42(11): 37
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Received: Dec. 8, 2014
Accepted: --
Published Online: Nov. 30, 2015
The Author Email: Shuqi LOU (lou_shu_qi@163.com)