Acta Optica Sinica, Volume. 18, Issue 7, 886(1998)

Transmission Properties of Two Kinds of Fiber Probes in Scanning Near-Field Optical Microscopy

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    References(5)

    [1] [1] E. Betzig, J. K. Trautman. Near-field optics: microscopy, spectroscopy, and surface modification beyond the diffraction limit. Science, 1992, 257(5067): 189~195

    [2] [2] H. Heinzelmann, D. W. Pohl. Scanning near-field optical microscopy. Appl. Phys. (A), 1994, 59(1): 89~101

    [3] [3] J. Radojewski, N. Sotnik, H. Pagnia. Tip technology for optical scanning tunneling microscopy and its influence on image quality. Int. J. Electron., 1994, 76(5): 973~980

    [4] [4] D. Marcuse. Loss analysis of single-mode fiber splices. Bell Syst. Tech. J., 1977, 56(5): 703~718

    [6] [6] C. W. Barnard, J. W. Y. Lit. Mode transforming properties of tapered single-mode fiber microlenses. Appl. Opt., 1993, 32(12): 2090~2094

    CLP Journals

    [1] Chang'an Li, Lina Xu, Ning Gu. Electroless silver plating for metallization of near-field optical fiber probes[J]. Chinese Optics Letters, 2007, 5(10): 594

    [2] Yang Yongbin, Xu Wendong. Theoretical Analysis of Fabricating Near-field Optical Probe by Chemical Etching Method Combining Static Etching and Dynamic Etching[J]. Acta Optica Sinica, 2008, 28(s2): 367

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Transmission Properties of Two Kinds of Fiber Probes in Scanning Near-Field Optical Microscopy[J]. Acta Optica Sinica, 1998, 18(7): 886

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    Paper Information

    Category: Physical Optics

    Received: May. 26, 1997

    Accepted: --

    Published Online: Oct. 18, 2006

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