Opto-Electronic Engineering, Volume. 41, Issue 2, 33(2014)

Background Suppression of LCD Mura Defect Using B-spline Surface Fitting

LI Kun1,*... LI Hui1, LIU Yunjie2, LIANG Ping2 and LU Xiaopeng1 |Show fewer author(s)
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(4)

    [2] [2] LU C J,TSAI D M. Automatic Defect Inspection for LCDs Using Singular Value Decomposition [J]. International Journal of Production Research(S0020-7543),2005,43(21): 4589-4607.

    [3] [3] TSNENG Y H,TSAI D M. Defect Detection of Uneven Brightness in Low-contrast Images Using Basis Image Representation [J]. Pattern Recognition(S0031-3203),2010,43(3): 1129-1141.

    [5] [5] OH J H,KWAK D M,LEE K B,et al. Line Defect Detection in TFT-LCD Using Directional Filter Bank and Adaptive Multilevel Threshohding [J]. Key Engineering Materials(S1662-9795),2004,270/273: 233-238.

    [6] [6] LEE J,YOO S. Automatic Detection of Region-Mura Defect in TFT-LCD [J]. IEICE Transactions on Information and Systems(S0916-8532),2004,87(10): 2371-2378.

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    LI Kun, LI Hui, LIU Yunjie, LIANG Ping, LU Xiaopeng. Background Suppression of LCD Mura Defect Using B-spline Surface Fitting[J]. Opto-Electronic Engineering, 2014, 41(2): 33

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    Paper Information

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    Received: Sep. 2, 2013

    Accepted: --

    Published Online: Feb. 26, 2014

    The Author Email: Kun LI (QuentinLeeX@163.com)

    DOI:10.3969/j.issn.1003-501x.2014.02.006

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