Semiconductor Optoelectronics, Volume. 42, Issue 6, 809(2021)
Reliability Design and Analysis of Cathode Filament for Vacuum Fluorescent Display
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ZHANG Jianping, CHEN Dong, HU Jun, SONG Xinyi, LUO Qibo, MAO Yinjie. Reliability Design and Analysis of Cathode Filament for Vacuum Fluorescent Display[J]. Semiconductor Optoelectronics, 2021, 42(6): 809
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Received: Feb. 3, 2021
Accepted: --
Published Online: Feb. 14, 2022
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