Chinese Optics Letters, Volume. 13, Issue 8, 081601(2015)
Characterization of inclusions in KD2PO4 crystals
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Fig. 1. (a) Submicron-scale and (b) micron-scale defects in DKDP crystal detected by the light-scattering technique.
Fig. 2. Morphology of submicron-scale inclusion in the DKDP crystal observed by the TEM.
Fig. 3. The EDS result of the submicron-scale inclusion in the DKDP crystal.
Fig. 4. Morphology of the micron-scale inclusion in the DKDP crystal observed by the microscope PM6000.
Fig. 5. The result of the TOF-SIMS analysis. (a) The distribution of
Fig. 6. R-on-1 laser damage probability curve of the DKDP samples.
Fig. 7. Pinpoint damage initiated by the micron-scale inclusion in the DKDP crystal.
Table 1. The Mass Contents of Main Impurity Elements in the KH2PO4 Raw Material
View tableView in ArticleTable 1. The Mass Contents of Main Impurity Elements in the KH2PO4 Raw Material
Element Fe Cr Al Ba Ca Zn Mn Na Pb Mg Cu Cd ICP-MS (ppm)
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Junxiu Chang, Yuan Zhao, Guohang Hu, Yueliang Wang, Dawei Li, Xiaofeng Liu, Jianda Shao. Characterization of inclusions in KD2PO4 crystals[J]. Chinese Optics Letters, 2015, 13(8): 081601
Paper Information
Category: Materials
Received: Feb. 28, 2015
Accepted: May. 7, 2015
Published Online: Sep. 14, 2018
The Author Email: Yuan Zhao (yazhao@siom.ac.cn), Guohang Hu (huguohang@siom.ac.cn)
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