Optics and Precision Engineering, Volume. 16, Issue 7, 1223(2008)
SCM-based nanomechanical property measurement system of AFM
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YAN Yong-da, FEI Wei-dong, HU Zhen-jiang, CHENG Xiang-jie, SUN Tao, DONG Shen. SCM-based nanomechanical property measurement system of AFM[J]. Optics and Precision Engineering, 2008, 16(7): 1223
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Received: Nov. 21, 2007
Accepted: --
Published Online: Feb. 28, 2010
The Author Email: YAN Yong-da (yanyongda@yahoo.com.cn)
CSTR:32186.14.