Optics and Precision Engineering, Volume. 31, Issue 20, 3065(2023)

Defect detection of low-resolution ceramic substrate image based on knowledge distillation

Feng GUO1... Xiaodong SUN1, Qibing ZHU1,*, Min HUANG1 and Xiaoxiang XU2 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Advanced Process Control for Light Industry, Ministry of Education, Jiangnan University, Wuxi 2422, China
  • 2Wuxi CK Electric Control Equipment Co., Ltd, Wuxi 14400, China
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    Ceramic substrate is a vital foundational material of electronic devices, and implementing defect detection for ceramic substrates using machine vision technology combined with deep learning strategies holds significant importance in ensuring product quality. Increasing the field of view of the imaging equipment to make simultaneous imaging of multiple ceramic substrates possible can significantly improve the detection speed of a ceramic substrate. However, it also results in decreased image resolution and subsequently reduces the accuracy of defect detection. To solve these problems, a low-resolution ceramic substrate defect automatic detection method based on knowledge distillation is proposed. The method utilizes the YOLOv5 framework to construct a teacher network and a student network. Based on the idea of knowledge distillation, high-resolution image feature information obtained by the teacher network is used to guide the training of the student network to improve the defect detection ability of the student network for low-resolution ceramic substrate images. Moreover, a feature fusion module based on the coordinate attention (CA) idea is introduced into the teacher network, enabling it to learn features that adapt to both high-resolution and low-resolution image information, thus better guiding the training of the student network. Finally, a confidence loss function based on the gradient harmonizing mechanism (GHM) is introduced to enhance the defect detection rate. Experimental results demonstrate that the proposed ceramic substrate defect detection method based on knowledge distillation achieves an average accuracy and average recall of 96.80% and 90.01%, respectively, for the detection of five types of defect-stain, foreign matter, gold edge bulge, ceramic gap, and damage-in low-resolution (224×224) input images. Compared with current mainstream object detection algorithms, the proposed algorithm achieves better detection results.

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    Feng GUO, Xiaodong SUN, Qibing ZHU, Min HUANG, Xiaoxiang XU. Defect detection of low-resolution ceramic substrate image based on knowledge distillation[J]. Optics and Precision Engineering, 2023, 31(20): 3065

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    Paper Information

    Category: Information Sciences

    Received: Apr. 10, 2023

    Accepted: --

    Published Online: Nov. 28, 2023

    The Author Email: ZHU Qibing (zhuqib@163.com)

    DOI:10.37188/OPE.20233120.3065

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