Laser & Optoelectronics Progress, Volume. 56, Issue 19, 191004(2019)
Image Matching Algorithm Based on Exposure and Color Information
[4] Lowe D G. Object recognition from local scale-invariant features. [C]//Proceedings of the Seventh IEEE International Conference on Computer Vision, September 20-27, 1999, Kerkyra, Greece. New York: IEEE, 2, 6365386(1999).
[5] Harris C, Stephens M. A combined corner and edge detector. [C]//Proceedings of the Alvey Vision Conference 1988, September, August 31-September 2, 1988, Manchester, UK. [S.l.: s.n.], 147-151(1988).
[16] Zha Z S, Tian Q J, Wang J Z et al. Image match using distribution of colorful SIFT. [C]//2010 International Conference on Wavelet Analysis and Pattern Recognition, July 11-14, 2010, Qingdao, China. New York: IEEE, 150-153(2010).
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Qingpeng Zhang, Yu Cao. Image Matching Algorithm Based on Exposure and Color Information[J]. Laser & Optoelectronics Progress, 2019, 56(19): 191004
Category: Image Processing
Received: Apr. 4, 2019
Accepted: Apr. 19, 2019
Published Online: Oct. 12, 2019
The Author Email: Cao Yu (cyhit@163.com)