Acta Optica Sinica, Volume. 7, Issue 7, 622(1987)
Multivariate error analysis in ellipsometric determination of optical thin film parameters
Get Citation
Copy Citation Text
ZHAN YUANLING, WANG LI. Multivariate error analysis in ellipsometric determination of optical thin film parameters[J]. Acta Optica Sinica, 1987, 7(7): 622