Acta Photonica Sinica, Volume. 35, Issue 2, 224(2006)

Influence of Deposited Pressure on Refractive Index and Packing Density of ZrO2 Coatings by Electron Beam Evaporation

Hao Dianzhong*, Wu Fuquan, Ma Lili, Yan Bin, and Zhang Xu
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  • [in Chinese]
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    ZrO2 coatings were prepared by electron beam evaporation at different deposition pressure,while deposition rate was monitored and demonstrated by quartz crystal oscillation. Used the new spectroscopic ellipsometer and spectrophotometer to test about the ZrO2 deposited spectral character and measure the film refractive index. Calculated the packing density of thin-film according to wavelength deviation dispersion theory before and after the thin-film suck tide. It was found that the refractive index and packing density were increasing as the working pressure was decreasing.

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    Hao Dianzhong, Wu Fuquan, Ma Lili, Yan Bin, Zhang Xu. Influence of Deposited Pressure on Refractive Index and Packing Density of ZrO2 Coatings by Electron Beam Evaporation[J]. Acta Photonica Sinica, 2006, 35(2): 224

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    Paper Information

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    Received: Apr. 13, 2005

    Accepted: --

    Published Online: Jun. 3, 2010

    The Author Email: Dianzhong Hao (dzhhao2@163.com)

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