Fig. 1. Structure of Terahertz scattering-type scanning near-field optical microscopic system

Fig. 2. Morphological imaging of structure by AFM

Fig. 3. AFM topography and terahertz near-field micrograph of h-BN/Au/SiO₂ microstructure

Fig. 4. The morphology and near-field microscopic profile of h-BN/Au/SiO₂ microstructure

Fig. 5. Au-probe near field approach curve and simulation

Fig. 6. Effect of probe modulation amplitude on the near-field amplitude and contrast of Au and SiO₂ based on full-wave numerical simulation