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Study On Optical Communications, Volume. 50, Issue 4, 23001401(2024)

Design of Automatic Test System for 50 Gbit/s SFP56 Optical Module

Xuan GAO1,*... Zhen CAO1 and Lili ZHANG2 |Show fewer author(s)
Author Affiliations
  • 1Wuhan Research Institute of Posts and Telecommunications, Wuhan 430074, China
  • 2Wuhan Molex Communications Co., Ltd., Wuhan 430074, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (5)
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    Figures & Tables(5)
    The structure of the test system

    Fig. 1. The structure of the test system

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    Register value reading and writing (left) and DDM acquisition (right)

    Fig. 2. Register value reading and writing (left) and DDM acquisition (right)

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    Parameter configuration and eye diagram

    Fig. 3. Parameter configuration and eye diagram

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    The BER versus received power

    Fig. 4. The BER versus received power

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    • Table 1. Statistical results of optical module test duration

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      Table 1. Statistical results of optical module test duration

      光模块编号自动测试时间/s手动测试时间/s
      183720004753119
      183720004851126
      183720004951129
      183720005047119
      183720005149126
      183720005246121
      183720005349117
      183720005452128
      183720005555116
      183720005647127
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    Xuan GAO, Zhen CAO, Lili ZHANG. Design of Automatic Test System for 50 Gbit/s SFP56 Optical Module[J]. Study On Optical Communications, 2024, 50(4): 23001401

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    Paper Information

    Category: Research Articles

    Received: Feb. 2, 2023

    Accepted: --

    Published Online: Aug. 15, 2024

    The Author Email: GAO Xuan (545941893@qq.com)

    DOI:10.13756/j.gtxyj.2024.230014

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology