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Laser Journal, Volume. 29, Issue 2, 40(2008)

Detection tiny deformation by carrier method in shearing speckle pattern interferometry

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    [in Chinese], [in Chinese], [in Chinese]. Detection tiny deformation by carrier method in shearing speckle pattern interferometry[J]. Laser Journal, 2008, 29(2): 40

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    Received: Jan. 5, 2008

    Accepted: --

    Published Online: Aug. 17, 2008

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology