Electronics Optics & Control, Volume. 23, Issue 8, 53(2016)

Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation

WANG Yan1... YUAN Lu1, NIE Xiao-liang2 and PENG Yan1 |Show fewer author(s)
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    WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53

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    Received: May. 25, 2015

    Accepted: --

    Published Online: Jan. 26, 2021

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2016.08.012

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