Electronics Optics & Control, Volume. 23, Issue 8, 53(2016)
Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation
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WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53
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Received: May. 25, 2015
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Published Online: Jan. 26, 2021
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