Electronics Optics & Control, Volume. 23, Issue 8, 53(2016)
Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation
This paper briefly introduces the characteristics and test status of active decoy system, as well as decoying efficiency test requirements. The main problems of test pattern of active decoy hardware-in-the-loop simulation are discussed based on existing simulation resource extension. On the basis of the design idea of the overall process closed-loop countermeasure and situation simulation using real active decoy system and anti-radiation missiles, the active decoy hardware-in-the-loop simulation test pattern is established.
Get Citation
Copy Citation Text
WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53
Category:
Received: May. 25, 2015
Accepted: --
Published Online: Jan. 26, 2021
The Author Email: