Electronics Optics & Control, Volume. 23, Issue 8, 53(2016)

Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation

WANG Yan1, YUAN Lu1, NIE Xiao-liang2, and PENG Yan1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    This paper briefly introduces the characteristics and test status of active decoy system, as well as decoying efficiency test requirements. The main problems of test pattern of active decoy hardware-in-the-loop simulation are discussed based on existing simulation resource extension. On the basis of the design idea of the overall process closed-loop countermeasure and situation simulation using real active decoy system and anti-radiation missiles, the active decoy hardware-in-the-loop simulation test pattern is established.

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    WANG Yan, YUAN Lu, NIE Xiao-liang, PENG Yan. Test Pattern Design for Active Decoy Hardware-in-the-Loop Simulation[J]. Electronics Optics & Control, 2016, 23(8): 53

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    Paper Information

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    Received: May. 25, 2015

    Accepted: --

    Published Online: Jan. 26, 2021

    The Author Email:

    DOI:10.3969/j.issn.1671-637x.2016.08.012

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