Journal of Applied Optics, Volume. 44, Issue 5, 1073(2023)

Design of high-resolution thin line structured light measurement system

Na HE... Jianhua WANG* and Zhiyi SHANG |Show fewer author(s)
Author Affiliations
  • College of Mechatronic Engineering, Xi'an Technological University, Xi'an 710021, China
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    Figures & Tables(14)
    Composition diagram of system
    Diagram of measurement principle
    Theoretical model of depth calibration
    System optical path
    Variation curves of gray contrast of group 7 element 1 with object distance
    Image obtained from resolution target taken by imaging system
    Contrast fitting line of each element in group 7
    Fringe patterns containing height difference information taken in different areas of field of view
    Fringe width and its rate of change curve
    Surface quality of measured object
    Fringe pattern with width of 8.96 μm
    • Table 1. Imaging contrast data for each element in group 7

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      Table 1. Imaging contrast data for each element in group 7

      元素序号分辨率/µm解析力/lp/mm水平条纹对比度竖直条纹对比度平均对比度
      7.13.91128.000.4050.5380.452
      7.23.48144.000.4300.5960.497
      7.33.10161.000.4400.6170.512
      7.42.76181.000.4750.6390.538
      7.52.46203.000.5120.6620.569
      7.62.19228.000.5250.6890.596
    • Table 2. Data of computed CCD unit pixel depth

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      Table 2. Data of computed CCD unit pixel depth

      视场序号12345均值
      条纹间距占像素数955.4955.1955.3955.4955.2955.3
      单位像素深度/µm0.544 30.544 40.544 30.544 30.544 40.544 3
    • Table 3. Variation of fringe width with projection distance

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      Table 3. Variation of fringe width with projection distance

      位置读数/mm条纹宽度/µm条纹宽度变化率/%
      10.6213.0545.61
      10.6411.6329.82
      10.6611.3226.32
      10.6810.5317.54
      10.709.597.02
      10.729.435.26
      10.748.960.00
      10.768.960.00
      10.789.121.75
      10.809.273.51
      10.829.435.26
      10.849.435.26
      10.8610.6919.30
      10.8811.7931.58
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    Na HE, Jianhua WANG, Zhiyi SHANG. Design of high-resolution thin line structured light measurement system[J]. Journal of Applied Optics, 2023, 44(5): 1073

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    Paper Information

    Category: Research Articles

    Received: Dec. 26, 2022

    Accepted: --

    Published Online: Mar. 12, 2024

    The Author Email: WANG Jianhua (王建华)

    DOI:10.5768/JAO202344.0503003

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