Debonding Defect Identification Method for Multi-layer Bonded Structures Based on LDA-CPSO-SVM Optimization

Li ZHENG; Chuang LIU; Jiaojiao REN; Dandan ZHANG; Lijuan LI; Jisheng XU

doi:10.3788/gzxb20215012.1212004

Acta Photonica Sinica, Volume. 50, Issue 12, 1212004(2021)

Debonding Defect Identification Method for Multi-layer Bonded Structures Based on LDA-CPSO-SVM Optimization

Li ZHENG, Chuang LIU^*, Jiaojiao REN, Dandan ZHANG, Lijuan LI, and Jisheng XU

Key Laboratory of Optoelectronic Measurement and Control and Optical Information Transmission Technology of Ministry of Education， College of Optoelectronic Engineering， Changchun University of Science and Technology， Changchun 130022， China

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Li ZHENG, Chuang LIU, Jiaojiao REN, Dandan ZHANG, Lijuan LI, Jisheng XU. Debonding Defect Identification Method for Multi-layer Bonded Structures Based on LDA-CPSO-SVM Optimization[J]. Acta Photonica Sinica, 2021, 50(12): 1212004

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jun. 25, 2021

Accepted: Aug. 25, 2021

Published Online: Jan. 25, 2022

The Author Email: LIU Chuang (liuchuang@cust.edu.cn)

DOI:10.3788/gzxb20215012.1212004

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology