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PhotoniX, Volume. 5, Issue 1, 22(2024)

Real-time monitoring of fast gas dynamics with a single-molecule resolution by frequency-comb-referenced plasmonic phase spectroscopy

Duy-Anh Nguyen1...2,†, Dae Hee Kim1,†, Geon Ho Lee1, San Kim3,4, Dong-Chel Shin1, Jongkyoon Park3,4, Hak-Jong Choi6, Seung-Woo Kim1, Seungchul Kim3,4,*, and Young-Jin Kim15,** |Show fewer author(s)
Author Affiliations
  • 1Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Science Town, Daejeon 34141, South Korea
  • 2Department of Mechatronic Engineering, Faculty of Mechanical Engineering, Ho Chi Minh City University of Technology (HCMUT), Vietnam National University Ho Chi Minh City, Vietnam
  • 3Department of Cogno-Mechatronics Engineering, College of Nanoscience and Nanotechnology, Pusan National University, Busan 46241, South Korea
  • 4Department of Optics and Mechatronics Engineering, College of Nanoscience and Nanotechnology, Pusan National University, Busan 46241, South Korea
  • 5School of Mechanical and Aerospace Engineering, Nanyang Technological University (NTU), 50 Nanyang Avenue, Singapore 639798, Singapore
  • 6Institute of Machinery and Materials, Nano-Convergence Mechanical Systems Research Division, Korea , 156, Gajeongbuk-Ro, Yuseong-Gu, Daejeon 34103, South Korea
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    Duy-Anh Nguyen, Dae Hee Kim, Geon Ho Lee, San Kim, Dong-Chel Shin, Jongkyoon Park, Hak-Jong Choi, Seung-Woo Kim, Seungchul Kim, Young-Jin Kim. Real-time monitoring of fast gas dynamics with a single-molecule resolution by frequency-comb-referenced plasmonic phase spectroscopy[J]. PhotoniX, 2024, 5(1): 22

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    Paper Information

    Category: Research Articles

    Received: Feb. 4, 2024

    Accepted: Jul. 29, 2024

    Published Online: Jan. 23, 2025

    The Author Email: Kim Seungchul (s.kim@pusan.ac.kr), Kim Young-Jin (yj.kim@kaist.ac.kr)

    DOI:10.1186/s43074-024-00140-9

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology