Acta Optica Sinica, Volume. 31, Issue 2, 214006(2011)
Mechanism Research of Pulsed-Laser Induced Damage to CCD Imaging Devices
[1] [1] Bartoil F. J., Esterowitz L., Kruer M. R. et al.. Thermal recovery processes in laser irradiated HgCdTe(PC) detectors[J]. Appl. Opt., 1975, 14(10): 2499~2507
[2] [2] Bartoil F. J., Esterowitz L., Allen R. et al.. A generalized thermal model for laser damage in infrared detectors[J]. Appl. Phys., 1976, 47(10): 2875~2881
[3] [3] Janesick J., Elliott T., Pool F.. Radiation damage in scientific charge-coupled devices[J]. IEEE Transactions on Nuclear Science, 1989, 36(1): 572~578
[4] [4] Meidinger N., Schmalhofer B., Struder L.. Alpha particle, proton and X-ray damage in fully depleted PN-junction CCD detectors for X-ray imaging and spectroscopy[J]. IEEE Transactions on Nuclear Science, 1998, 45(6): 2849~2856
[5] [5] Stefanov K. D., Tsukamoto T., Miyamoto A. et al.. Electron and neutron radiation damage effects on a two-phase CCD[J]. IEEE Transactions on Nuclear Science, 2000, 47(3): 1280~1291
[8] [8] Guo Shaofeng, Cheng Xiang′ai, Fu Xiquan et al.. Failure of array CCD irradiated by high-repetitive femto-second laser[J]. High Power Laser and Particle Beams, 2007, 19(17): 1783~1786
[12] [12] Kazuya Yonemoto. CCD/CMOS Image Sensor No Kiso to Ouyou[M]. Chen Rongting, Peng Meigui tranl., Beijing: Science Press, 1980, 113~114
[13] [13] Li F. M., Nixon O., Nathan A.. Degradation behavior and damage mechanisms of CCD image sensor with deep-UV laser radiation[J]. IEEE Transactions on Electron Devices, 2004, 51(12): 2229~2236
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Qiu Dongdong, Zhang Zhen, Wang Rui, Jiang Tian, Cheng Xiang′ai. Mechanism Research of Pulsed-Laser Induced Damage to CCD Imaging Devices[J]. Acta Optica Sinica, 2011, 31(2): 214006
Category: Lasers and Laser Optics
Received: May. 24, 2010
Accepted: --
Published Online: Jan. 30, 2011
The Author Email: Dongdong Qiu (qidooo@163.com)