Acta Optica Sinica, Volume. 31, Issue 2, 214006(2011)
Mechanism Research of Pulsed-Laser Induced Damage to CCD Imaging Devices
Aiming at the phenomenon that irreversible bright line and all-field blank screen happens in the CCD irradiated by pulsed laser, the resistance between driving electrodes and substrate is measured, damage micro-morphological image of different layers in the facular area is observed, exported waveforms are detected, and the damage mechanisms for CCD are analyzed in detail. The results show that high power pulse laser induces the ablation at different layers of CCD, and increases the dark current and leakage current, which leads the failure of the device.
Get Citation
Copy Citation Text
Qiu Dongdong, Zhang Zhen, Wang Rui, Jiang Tian, Cheng Xiang′ai. Mechanism Research of Pulsed-Laser Induced Damage to CCD Imaging Devices[J]. Acta Optica Sinica, 2011, 31(2): 214006
Category: Lasers and Laser Optics
Received: May. 24, 2010
Accepted: --
Published Online: Jan. 30, 2011
The Author Email: Dongdong Qiu (qidooo@163.com)