Laser & Optoelectronics Progress, Volume. 54, Issue 12, 121202(2017)
Influence of Residual Stress on Young Modulus Detection of SiO2 Bulk Materials by Laser-Induced Surface Ultrasonic Wave Technique
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Sui Xiaole, Xiao Xia, Qi Haiyang, Kong Tao. Influence of Residual Stress on Young Modulus Detection of SiO2 Bulk Materials by Laser-Induced Surface Ultrasonic Wave Technique[J]. Laser & Optoelectronics Progress, 2017, 54(12): 121202
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: May. 25, 2017
Accepted: --
Published Online: Dec. 11, 2017
The Author Email: Xia Xiao (xiaxiao@tju.edu.cn)
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