Chinese Journal of Quantum Electronics, Volume. 41, Issue 6, 872(2024)

Research on calibration method of large‐aperture meter‐scale laser beam quality measuring device

ZHU Fei1...2,3,*, HOU Zaihong1,3, WANG Gangyu1,2,3, QIN Laian1,3, JIN Xu1,3, and WU Decheng13 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Atmospheric Optics, Anhui Institute of Optics and Fine Mechanics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China
  • 2Science Island Branch of Graduate School, University of Science and Technology of China, Hefei 230026, China
  • 3Advanced Laser Technology Laboratory of Anhui Province, Hefei 230037, China
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    Figures & Tables(12)
    Beam splitting way of single cube prism
    Three-beam splitting way of cubic prism group
    Cube prism group inverted triangle beam splitter (a) and lens array hexagonal layout (b)
    Three scanning modes. (a) One way scanning; (b) Continuous scanning; (c) Scanning from middle to both sides
    One way scanning process
    wavefront image under ideal wavefront, the same residual error, and three scanning modes.(a) One way scanning; (b) Continuous scanning; (c) Scanning from middle to both sides
    Effect of wavefront measurement of error is 5 μrad with measuring system diameter is 1.27 m and β is 2.33.(a) Initial wavefront; (b) Recovered wavefront; (c) Recovered error
    Effect of wavefront measurement of error is 5 μrad with measuring system diameter is 1.27 m and β is 2.33. (a) Initial wavefront; (b) Recovered wavefront; (c) Recovered error
    Effect of wavefront measurement of error is 0.5 μrad with measuring system diameter is 1.27 m and β is 2.33.(a) Initial wavefront; (b) Recovered wavefront; (c) Recovered error
    • Table 1. Initial aberration caused by the residual error of the parallelism of calibration light source under different scanning mode

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      Table 1. Initial aberration caused by the residual error of the parallelism of calibration light source under different scanning mode

      Parallelism error /μradScanning modeAberrations of the first 6 orders of Zernike polynomial
      Z1Z2Z3Z4Z5Z6
      10one way scanning00.50620.62670.00020.32000.0004
      continuous scanning00.31240.62670.03140.32000.0444
      scanning from middle to both sides00.0765-0.00160.00010.32000.0001
      5one way scanning00.25310.31340.00010.16000.0002
      continuous scanning00.15620.31340.01570.16000.0222
      scanning from middle to both sides00.0383-0.00080.00000.16000.0000
      3one way scanning00.15190.18800.00010.09600.0001
      continuous scanning00.09370.18800.00940.09600.0133
      scanning from middle to both sides00.0230-0.00050.00000.09600.0000
    • Table 2. Fluctuation of β value using one way scanning mode with 127 mm diameter of the measuring system

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      Table 2. Fluctuation of β value using one way scanning mode with 127 mm diameter of the measuring system

      β value of initial wavefrontError/μradβ value of recovered wavefront
      1.46102.90
      51.91
      31.72
      11.41
      2.33104.43
      53.46
      32.63
      12.33
      4.53107.20
      56.22
      35.10
      14.53
    • Table 3. Fluctuation of β value using one way scanning mode with 1.27 m diameter of the measuring system

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      Table 3. Fluctuation of β value using one way scanning mode with 1.27 m diameter of the measuring system

      β value of initial wavefrontError/μradβ value of recovered wavefront
      1.462.04.94
      1.02.84
      0.82.43
      0.51.92
      0.31.61
      2.332.05.25
      1.03.30
      0.83.00
      0.52.58
      0.32.28
      4.532.07.09
      1.05.35
      0.85.04
      0.54.69
      0.34.48
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    Fei ZHU, Zaihong HOU, Gangyu WANG, Laian QIN, Xu JIN, Decheng WU. Research on calibration method of large‐aperture meter‐scale laser beam quality measuring device[J]. Chinese Journal of Quantum Electronics, 2024, 41(6): 872

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    Paper Information

    Category:

    Received: Dec. 12, 2022

    Accepted: --

    Published Online: Jan. 8, 2025

    The Author Email:

    DOI:10.3969/j.issn.1007-5461.2024.06.004

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