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Chinese Optics Letters, Volume. 9, Issue 10, 102101(2011)

Optical characterization of antimony-based bismuth-doped thin films with different annealing temperatures

Xinmiao Lu1, Yiqun Wu1,2, Yang Wang1, and Jinsong Wei1
Author Affiliations
  • 1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Key Lab of Functional Inorganic Material Chemistry, Ministry of Education, Heilongjiang University, Harbin 150080, China
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    Xinmiao Lu, Yiqun Wu, Yang Wang, Jinsong Wei. Optical characterization of antimony-based bismuth-doped thin films with different annealing temperatures[J]. Chinese Optics Letters, 2011, 9(10): 102101

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    Paper Information

    Received: Feb. 22, 2011

    Accepted: Apr. 28, 2011

    Published Online: Aug. 24, 2011

    The Author Email:

    DOI:10.3788/col201109.102101

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology