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High Power Laser and Particle Beams, Volume. 32, Issue 5, 051001(2020)

Optical elements defect online detection method based on camera array

Wenxue Zhang1...2,3, Jihong Wang1,2,3,*, and Ge Ren1,23 |Show fewer author(s)
Author Affiliations
  • 1Key Laboratory of Optical Engineering, Chinese Academy of Sciences, Chengdu 610209, China
  • 2Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
  • 3University of Chinese Academy of Sciences, Beijing 100049, China
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    [4] [4] Thompson C E L. Optics damage inspection f the NIF[C]Proc of SPIE. 1999, 3492:921932.

    [5] [5] Conder A, Alger T, Azevedo S, et al. Final optics damage inspection (FODI) f the National Ignition Facility[C]Proc of SPIE. 2008:672010.

    [16] [16] ZelnikMan L, Irani M. Multiview subspace constraints on homographies[C]International Conference on Computer Vision. 1999.

    [17] [17] Hartley R, Zisserman A. Multiple view geometry in computer vision[M]. Cambridge: Cambridge University Press, 2003.

    [18] Zhang Z. A flexible new technique for camera calibration[J]. IEEE Trans Pattern Analysis and Machine Intelligence(TPAMI), 22, 1330-1339(2000).

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    [1] Zhengzheng Hu, Liuyang Ma, Hao Hu. A fault diagnosis method for optical elements based on infrared and visible light videos[J]. High Power Laser and Particle Beams, 2023, 35(8): 089002

    [2] Yanhua Shao, Yupei Feng, Xiaoqiang Zhang, Hongyu Chu. Using deep learning for surface defects identification of optical components[J]. High Power Laser and Particle Beams, 2022, 34(11): 112002

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    Wenxue Zhang, Jihong Wang, Ge Ren. Optical elements defect online detection method based on camera array[J]. High Power Laser and Particle Beams, 2020, 32(5): 051001

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    Paper Information

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    Received: Dec. 2, 2019

    Accepted: --

    Published Online: Apr. 24, 2020

    The Author Email: Wang Jihong (wangjihong19@sina.com)

    DOI:10.11884/HPLPB202032.190444

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology