Laser & Optoelectronics Progress, Volume. 58, Issue 18, 1811026(2021)

Evaluation of Distributed Optoelectronic System Properties

Jiangyong Li*, Miaoyan Wang, and Chang Ben
Author Affiliations
  • North China Research Institute of Electro-Optics, Beijing 100015, China
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    Figures & Tables(4)
    Super-resolution reconstruction images of distributed optoelectronic system. (a) Mid-wave infrared images of ground captured from different UAV platforms; (b) large field of view image obtained by SIFT registration; (c) super-resolution image reconstructed based on learning; (d)(e) super-resolution results after amplification
    MTF distribution images. (a) MTF distribution image of original figure;(b) MTF distribution image after super-resolution reconstruction
    MTF curves
    • Table 1. Quality comparison between original image and reconstructed super-resolution image

      View table

      Table 1. Quality comparison between original image and reconstructed super-resolution image

      ParameterSNR /dBInformation entropyGradient value
      Original image22.85.321.035
      Reconstructed image25.16.271.123
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    Jiangyong Li, Miaoyan Wang, Chang Ben. Evaluation of Distributed Optoelectronic System Properties[J]. Laser & Optoelectronics Progress, 2021, 58(18): 1811026

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    Paper Information

    Category: Imaging Systems

    Received: Jun. 26, 2021

    Accepted: Aug. 9, 2021

    Published Online: Sep. 3, 2021

    The Author Email: Li Jiangyong (ljybj11@163.com)

    DOI:10.3788/LOP202158.1811026

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