Fig. 1. Schematic diagram of semi-silicon PL imaging

Fig. 2. Flow chart of solar cell defect detection

Fig. 3. Four typical defects on solar cells

Fig. 4. Gaussian kernel selection analysis

Fig. 5. Image enhancement process

Fig. 6. Images detected by corner points

Fig. 7. Non-corner point defect segmentation

Fig. 8. Comparison of dimension reduction schemes

Fig. 9. Characteristic distinction degree

Fig. 10. Optimization process for PSO-SVM

Fig. 11. Defect detection results