Optoelectronics Letters, Volume. 19, Issue 1, 49(2023)
Reflectivity measurement technology of special high reflective mirrors and uncertainty analysis of measurement results
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LIANG Xiaolin, ZHOU Songqing, LI Xiaowu, ZHOU Ling, and CHEN Huihuang. Reflectivity measurement technology of special high reflective mirrors and uncertainty analysis of measurement results[J]. Optoelectronics Letters, 2023, 19(1): 49
Category: Measurement Devices and Methods
Received: Jul. 21, 2022
Accepted: Sep. 14, 2022
Published Online: Mar. 17, 2023
The Author Email: Songqing ZHOU (122322855@qq.com)