Laser & Optoelectronics Progress, Volume. 60, Issue 8, 0811016(2023)

3D Optical Sectioning Microscopy with Sparse Structured Illumination

Yunze Lei1、†, Peng Gao1、†,**, Xing Liu1, Jiaoyue Li1, Xiaofei Chen1, Juanjuan Zheng1, Sha An1、*, Dan Dan2, and Baoli Yao2
Author Affiliations
  • 1School of Physics, Xidian University, Xi'an 710071, Shaanxi, China
  • 2State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, Shaanxi, China
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    Figures & Tables(9)
    Schematic optical path of SSI-3DSM
    Properties of the resonant scanning mirror. (a) The relationship between the scanning range of focus and different input voltages; (b) correspondence between focus position and scanning time
    Control principle of instrument signal. (a) Diagram of control signal timing; (b) the diagram of the control flow chart
    Background noise subtraction of SSI-3DSM
    Characterization of the period and phase shift of sparse stripe structured illumination. (a) Acquired image stack of sparse stripe structured illumination in different phase shift, the sample is a broad-band mirror (400-700 nm); (b) estimation of the period and phase for sparse stripe structured illumination in a image stack
    Axial resolution estimation of SSI-3DSM. (a) SSI-3DSM image stack of the fluorescent beads obtained from different axial planes; (b) axial resolution determination (FWHM) of SSI-3DSM; (c) axial resolution determination (FWHM) of 3D-scanning wide-field mode
    SBR estimation of scanning wide-field microscopy and SSI-3DSM. (a) Fluorescent images of fluorescent beads obtained with scanning wide-field (left) and SSI-3DSM (right) modes; (b) intensity profile along the dash-line in the inset ② crossing an individual bead from both the scanning wide-field and SSI-3DSM images; (c) SBR estimation of scanning wide-field and SSI-3DSM
    Comparison of OS-SIM and SSI-3DSM modes on optical sectioning capability. (a) Images of fluorescent beads in SSI-3DSM (top) and the scanning wide-field (bottom) images; (b) images of fluorescent beads in OS-SIM (top) and wide-field (bottom) modes; (c) signal-to-background ratio statistics for wide-field, OS-SIM, scanning wide-field, and SSI-3DSM modes
    SSI-3DSM imaging results of a metal step sample. (a) Comparison of the image qualities of the scanning wide-field and SSI-3DSM mode for a metal step sample; (b) three-dimensional optical sectioning image of a metal step sample,the different color represents the different height of the sample; (c) the height distribution along the dash-line in Fig.9 (b)
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    Yunze Lei, Peng Gao, Xing Liu, Jiaoyue Li, Xiaofei Chen, Juanjuan Zheng, Sha An, Dan Dan, Baoli Yao. 3D Optical Sectioning Microscopy with Sparse Structured Illumination[J]. Laser & Optoelectronics Progress, 2023, 60(8): 0811016

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    Paper Information

    Category: Imaging Systems

    Received: Jan. 5, 2023

    Accepted: Feb. 22, 2023

    Published Online: Apr. 24, 2023

    The Author Email: Gao Peng (peng.gao@xidian.edu.cn), An Sha (ansha@xidian.edu.cn)

    DOI:10.3788/LOP230456

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