Acta Photonica Sinica, Volume. 32, Issue 9, 1145(2003)
The Study of the Optical-thickness Tolerance of Quarter-Films
[1] [1] Macleod H A. Monitoring of optical coating.Applied Optics,1981,20(3): 82~92
[2] [2] Carts Y A. Computers Optimize Thin Film Designs.Laser Focus World.1991,27(10):34~36
[3] [3] Macleod H A. Thin-Film Optical Filters. London:Adam Hilger Ltd.,1969.396~403
[4] [4] Greiner H. Robust optical coating design with evolutionary strategies. Applied Optics,1996,35(12): 5477~5498
[5] [5] Bousquet P.Optical filters: monitoring process allowing the auto-correction of thickness error.Thin Solid Films,1972,19(1):285~299
[6] [6] Minkov D,Swanepoel R.Computerization of the Optical Characteristics of A Thin Dielectric Film.Optical Engineering,1993,32(12):1023~1041
[7] [7] Macleod H A. The effect of errors in the optical monitoring of narrow band all-dielectric thin film optical filters.Optical Acta,1974,21(4):492~497
Get Citation
Copy Citation Text
[in Chinese], [in Chinese]. The Study of the Optical-thickness Tolerance of Quarter-Films[J]. Acta Photonica Sinica, 2003, 32(9): 1145