Acta Photonica Sinica, Volume. 32, Issue 9, 1145(2003)

The Study of the Optical-thickness Tolerance of Quarter-Films

[in Chinese]1 and [in Chinese]2
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  • 1[in Chinese]
  • 2[in Chinese]
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    References(7)

    [1] [1] Macleod H A. Monitoring of optical coating.Applied Optics,1981,20(3): 82~92

    [2] [2] Carts Y A. Computers Optimize Thin Film Designs.Laser Focus World.1991,27(10):34~36

    [3] [3] Macleod H A. Thin-Film Optical Filters. London:Adam Hilger Ltd.,1969.396~403

    [4] [4] Greiner H. Robust optical coating design with evolutionary strategies. Applied Optics,1996,35(12): 5477~5498

    [5] [5] Bousquet P.Optical filters: monitoring process allowing the auto-correction of thickness error.Thin Solid Films,1972,19(1):285~299

    [6] [6] Minkov D,Swanepoel R.Computerization of the Optical Characteristics of A Thin Dielectric Film.Optical Engineering,1993,32(12):1023~1041

    [7] [7] Macleod H A. The effect of errors in the optical monitoring of narrow band all-dielectric thin film optical filters.Optical Acta,1974,21(4):492~497

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    [in Chinese], [in Chinese]. The Study of the Optical-thickness Tolerance of Quarter-Films[J]. Acta Photonica Sinica, 2003, 32(9): 1145

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    Paper Information

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    Received: Sep. 18, 2002

    Accepted: --

    Published Online: Sep. 17, 2007

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