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Chinese Journal of Quantum Electronics, Volume. 30, Issue 2, 180(2013)

Quantum fidelity based on magnetic resonance force microscopy system

Hui-ling LIU*... Ren REN, Wei-ren WANG and Xuan LI |Show fewer author(s)
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    LIU Hui-ling, REN Ren, WANG Wei-ren, LI Xuan. Quantum fidelity based on magnetic resonance force microscopy system[J]. Chinese Journal of Quantum Electronics, 2013, 30(2): 180

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    Received: Apr. 13, 2012

    Accepted: --

    Published Online: Apr. 7, 2013

    The Author Email: Hui-ling LIU (lhl851128@163.com)

    DOI:10.3969/j.issn.1007-5461.2013.02.009

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology