Acta Optica Sinica, Volume. 34, Issue 5, 512001(2014)

Sub-Micron Precision Measurement of Radius of Curvature and Uncertainties Analysis

Peng Shijun* and Miao Erlong
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    Peng Shijun, Miao Erlong. Sub-Micron Precision Measurement of Radius of Curvature and Uncertainties Analysis[J]. Acta Optica Sinica, 2014, 34(5): 512001

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Sep. 25, 2013

    Accepted: --

    Published Online: Apr. 18, 2014

    The Author Email: Shijun Peng (shijun_peng@qq.com)

    DOI:10.3788/aos201434.0512001

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