Optical Instruments, Volume. 42, Issue 5, 50(2020)

Design of high resolution KB microscopy system based on aspherical mirror

Jingyi LEI... Jie XU, Liang CHEN, Xinye XU, Wenjie LI and Baozhong MU* |Show fewer author(s)
Author Affiliations
  • School of Physics Science and Engineering, Tongji University, Shanghai 200092, China
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    Figures & Tables(9)
    Schematic of KB microscopy system optical assembly
    Optical path of aspherical KB microscope
    Influence of optical parameters on spatial resolution of aspherical KB microscope
    Grazing incidence focusing of the aspheric mirror
    Theoretical calculation of vertical axis aberration of aspherical KB microscope and simulation result of ray tracing
    Reflectivity of W/Si multilayer at 6.4 keV
    Result of aspherical KB microscope imaging test
    Spatial resolution of aspherical KB microscope
    • Table 1.

      Optical parameters of aspherical X-ray KB microscope

      非球面X射线KB显微镜的光学结构参数

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      Table 1.

      Optical parameters of aspherical X-ray KB microscope

      非球面X射线KB显微镜的光学结构参数

      方向Unknown environment 'document'/mm MUnknown environment 'document'd/mm a/mm b/mm h/mm
      子午方向177.8681.281080011.297.09
      弧矢方向202.866.891.211080011.297.51
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    Jingyi LEI, Jie XU, Liang CHEN, Xinye XU, Wenjie LI, Baozhong MU. Design of high resolution KB microscopy system based on aspherical mirror[J]. Optical Instruments, 2020, 42(5): 50

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    Paper Information

    Category: OPTICAL SYSTEM

    Received: Dec. 10, 2019

    Accepted: --

    Published Online: Jan. 6, 2021

    The Author Email: MU Baozhong (mubz@tongji.edu.cn)

    DOI:10.3969/j.issn.1005-5630.2020.05.008

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