Optics and Precision Engineering, Volume. 18, Issue 12, 2616(2010)
Contamination failure analysis and repairing for double side two dimensional silicon microstrip detectors
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HAN Li-xiang, LI Zhan-kui, LU Wan, HU Jun, YANG Yan-yun, WANG Zhu-sheng. Contamination failure analysis and repairing for double side two dimensional silicon microstrip detectors[J]. Optics and Precision Engineering, 2010, 18(12): 2616
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Received: Apr. 30, 2010
Accepted: --
Published Online: Jan. 26, 2011
The Author Email: Li-xiang HAN (lixiang-han@impcas.ac.cn)
CSTR:32186.14.
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