Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism

Zhenwei Zhang; Yuejin Zhao; Yinxiao Miao; Cunlin Zhang

doi:10.3788/AOS202242.0411002

Acta Optica Sinica, Volume. 42, Issue 4, 0411002(2022)

Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism

Zhenwei Zhang^1,2, Yuejin Zhao^1、*, Yinxiao Miao³, and Cunlin Zhang²

¹Beijing Key Laboratory for Precision Optoelectronic Measurement Instrument and Technology, School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China

²Key Laboratory of Terahertz Optoelectronics, Beijing Engineering Research Center of Terahertz and Infrared Technology, Beijing Advanced Innovation Center for Imaging Theory and Technology, Department of Physics, Capital Normal University, Beijing 100048, China

³Beijing Aerospace Institute for Metrology and Measurement Technology, Beijing 100076, China

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Zhenwei Zhang, Yuejin Zhao, Yinxiao Miao, Cunlin Zhang. Terahertz Nondestructive Testing Imaging Technology Based on Linear Frequency Modulation Mechanism[J]. Acta Optica Sinica, 2022, 42(4): 0411002

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Paper Information

Category: Imaging Systems

Received: Jul. 14, 2021

Accepted: Aug. 27, 2021

Published Online: Jan. 29, 2022

The Author Email: Zhao Yuejin (yjzhao@bit.edu.cn)

DOI:10.3788/AOS202242.0411002

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