[1] [1] Jellison G E. Handbook of ellipsometry [M]. Springe,2005.

[2] [2] Chang C, Chen W, Chen Y, et al. Recent progress on two-dimensional materials [ J]. Acta Physico Chim. Sin. ,2021, 37(12): 2108017.

[3] [3] Yang F, Cheng S, Zhang X, et al. 2D organic materials for optoelectronic applications [J]. Adv. Mater. , 2018, 30(2): 1702415. 1-1702415. 27.

[4] [4] Hilfiker J N, Hong N, Schoeche S. Mueller matrix spectroscopic ellipsometry[J]. Adv. Opt. Techn. , 2022, 11(3-4): 59-91.

[5] [5] Drude P. Ueber die Gesetze der Reflexion und brechung des lichtes an der grenze absorbirender krystalle[J]. Annalen Der Physik, 1887. 268(12):584-625.

[6] [6] Taya S A, El-Agez T M. Scanning ellipsometer using a fixed phase retarder and rotating polarizer and analyzer[J].Acta Physica Polonica A, 2013, 123(2):183-184.

[7] [7] Zhang, Song Chen, Chao Jiang, et al. Dynamic characteristics of nematic liquid crystal variable retarders investigated by a high-speed polarimetry[J]. Journal of optics, 2019,21(6).

[10] [10] Oriol A, John F, Bao W. Mueller matrix polarimetry with four photoelastic modulators: theory and calibration [J].Applied optics, 2012, 51(28): 6805-17.

[11] [11] López-Téllez J M, Bruce N C. Mueller-matrix polarimeter using analysis of the nonlinear voltage-retardance relationship for liquid-crystal variable retarders [J]. Applied Optics,2014, 53(24), 5359-66.

[12] [12] Kuo C W, Han C Y, Jhou J Y, et al. Using a fast dualwavelength imaging ellipsometric system to measure the flow thickness profile of an oil thin film[J]. Applied Surface Science, 2017, 421(2017): 465-470.

[13] [13] Li K, Wang S, Wang L, Yu H, et al. Fast and sensitive ellipsometry- based biosensing [ J]. Sensors, 2018, 18(1): 15.

[14] [14] Zhang S, Jiang H, Gu H, et al. High-speed mueller matrix ellipsometer with microsecond temporal resolution[J].Optics Express, 2020, 28(8): 10873-10887.

[16] [16] Zhang R, Wang Z, Li K, Chen Y, et al. Spectropolarimetric measurement based on a fast-axis-adjustable photoelastic modulator [J]. Applied optics, 2019, 58(2): 325.