International Journal of Extreme Manufacturing, Volume. 4, Issue 3, 35201(2022)
Robust and high-sensitivity thermal probing at the nanoscale based on resonance Raman ratio (R3)
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Hamidreza Zobeiri, Nicholas Hunter, Shen Xu, Yangsu Xie, Xinwei Wang. Robust and high-sensitivity thermal probing at the nanoscale based on resonance Raman ratio (R3)[J]. International Journal of Extreme Manufacturing, 2022, 4(3): 35201
Received: Nov. 26, 2021
Accepted: --
Published Online: Jan. 23, 2023
The Author Email: Shen Xu (shxu16@sues.edu.cn)